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Die attach interface property characterization as function of

temperature using cohesive zone modeling method

Citation for published version (APA):

Ma, X. S., Zhang, G. Q., Sluis, van der, O., Jansen, K. M. B., Driel, van, W. D., & Ernst, L. J. (2010). Die attach interface property characterization as function of temperature using cohesive zone modeling method. In Proceedings of the 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE 2010), 26-28 April 2010, Bordeaux, France (pp. 1-8). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ESIME.2010.5464533

DOI:

10.1109/ESIME.2010.5464533

Document status and date: Published: 01/01/2010 Document Version:

Publisher’s PDF, also known as Version of Record (includes final page, issue and volume numbers) Please check the document version of this publication:

• A submitted manuscript is the version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website.

• The final author version and the galley proof are versions of the publication after peer review.

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Die Attach Interface Property Characterization as Function

of Temperature

Using Cohesive Zone Modeling Method

Xiaosong Mal, G.Q. Zhang), O. van der Sluis 2, K.M.B. Jansen), W.D van Driel),3,L.J. Ernst' Charles Regard" 5,6, Christian Gautier" 5, HeleneFremont"

) Delft University of Technology, Mekelweg 2, 2628 CD Delft, the Netherlands 2Philips Applied Technologies, High Tech Campus 7,5656 AE Eindhoven, the Netherlands

3NXP, Gerstweg 2, 6534 AE Nijmegen, the Netherlands

4NXP Semiconductors, 2, rue de la Girafa BP 5120, 14079 Caen cedex5 France 5LaMIPS, Universite de Caen, 2, rue de la Girafe, 14000 Caen, France

6IMS Bordeaux Universite de Bordeaux, 351 cours de la liberation, 33405 Talence, France Phone : +31-(0)15-2782859, Fax: 31-(0)15-2782150 e-mail:X.Ma@tudelft.nl

t

b]'---J

~

Fig.2(d) DCD Mode I

Fig. 2(e) Mixed mode Illl Fig.1(b) Sliding mode

,

,

,

~ - - - -

-Fig.l (c) Tear ing mode

Therefore, different failure modes are investigated by different test methods . Fig. 2 shows some different forms of modes [1] resulted by different loadings.

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Fracture mechanics has been studied for a long time. There are three modes of crack extension in fracture mechanics : opening mode, sliding mode and tearing mode (see Fig. 1). The opening mode, Mode I, is characterized by the symmetric separation of the crack surfaces with respect to the plane. The sliding mode, Mode II, is characterized by displacement in which the crack surfaces slide over one another perpendicular to the leading edge of the crack. The tearing mode, Mode III, finds the surfaces sliding with respect to another parallel to the leading edge. Mode I and II are common failure modes.Itcan be seen that different failures are caused by different loadings.

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Fig.2Mode IL (a) ENF; (b) ELS ; (c) 4-point ENF

Fig.1(a) Opening mode Abstract: Interface delamination is one of the most

important issues in the microelectronic packaging industry. Silver filled die attach is a typical adhesive used between the die and copper die pad for its improved heat dissipation capacity. Delamination between die attach and die pad will severely impact the heat conduction and result in product failure. In order to predict this delamination , interface properties should be characterized. Tri-material, copper-die attach-EMC, samples are made according to the package processes . A four point bending test system is established in order to perform delamination tests at different temperatures using a universal tester Zwick/Roell Z005. In addition , a Keyence optical system is mounted to capture a series of pictures during the delamination processes . This will provide

the delamination geometry information needed for

determining the interface properties. Four point bending tests have been performed at room temperature, 40, 60, 85, and 150°C respectively. In addition pre conditioning sample are also tested at room temperature and 85°C respectively after 48 hours pre conditioned at 85°C/85%RH . . Experiments show that the "critical delamination load" decreases steadily with temperature increasing . Experiments also show moisture has no effects on the "critical delamination load" compared with the dry samples tested at the same temperatures. This means that moisture has no effects on the interface toughness between copper and die attach. To quantify the interface properties, numerical simulations of the four point bending test have been performed by using a finite element model comprising cohesive zone elements which will describe the transient delamination process during the four point bending tests. Correspondently, the interface toughness decreases from 26.5J/m2 at room temperature to 1.9J/m2 at 150°C as calculated from the cohesive zone element model. These results show that temperature has a large effect on the interface toughness . By means of an extensive model parameter sensitivity study, combined with the measured delamination length in horizontal direction along the copper-die attach interface at room temperature critical opening value has been determined .

1.Introduction

978-1-4244-7027-3101$26.00 @20101EEE 1

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Figure 2(d) shows the specimen of Double Cantilever

Beam (DCB) for ModeI. The data analysis is based on the

Irwin-Kies equation [1]. This equation is then modified by Williams and JIS (Japanese Industrial Standards) respectively [2, 3]. They are referred to as CBT (corrected beam theory) and modified compliance calibration (MCC) by Hojo [4]. The mode II test, see Fig. 2(a), (b), (c) remains controversial for practical reasons, such as unstable propagation in the ENF specimen, friction effects and difficulty in defining a starter defect. The specimen for mixed mode bending (MMB), Fig. 2(e) as introduced by Reeder, Crews and Reeder [5, 6] has become the most widely used specimen for the determination of mixed mode envelopes. These types of specimen are suitable for bi-material samples. For the tri-materials samples, some modifications are needed to ensure that the delamination occurs at the required interface. Based on Charalambides [7], a four point bending Mode I tool was designed and constructed. This test method shows stable delamination and reproducible results.

2.Experimental samples and equipment

2.1. Tri-material sample

In order to obtain the similar interface toughness as in the actual package, samples are made according to the packaging processes. The test samples are tri-material strips consisting of copper layer (0.2mm in thickness), epoxy molding compound layer [EMC] (0.6mm in thickness) and a die attach adhesive

(60pm) layer in between. The sample dimension is

60xlOxO.85 mm' .

A thin layer of adhesive glue is dispensed on the surface of the copper lead frame by using the flexible foil stencil, which is fixed in a frame. The thickness of the adhesive glue on the surface of the lead frame is controlled by the thickness of the stencil foil.

After dispensing adhesive glue, samples are placed in a pre-heated oven at 180°C for 15 minutes for curing. And then the leadframe is placed in the mold. EMC molding is finished in a pre-heated mold at 180°C within 60 seconds and post cured in the mold for 90 seconds. The final map mold is shown in Fig. 3(a). Before cutting off the sample, the map mold is post cured at 175°C for 4 hours to ensure that the epoxy molding compound is fully cured. Then the map molds

are cut into 60x9mm2strips, see Fig. 3(b).

Fig.3(a) Map mold Fig.3(b) Cut samples

To trigger the interface delamination, a pre-defined notch (0.5mm wide and 80% depth of EMC) is created in the epoxy

-2-molding compound materials by sawing. The geometry and dimensions of the sample are shown in FigA.

Fig.4 Geometry and dimensions ofthe sample 2.2 Setup ofFour Point Bending

A special four point bending tool is designed and manufactured to investigate the interface toughness. Fig.5 schematically shows the test setup while the actual four point bending tool, which consists three parts, is shown in Fig.6. The first part is the four point bending frame which is used to support the two rollers. The second part consists of two rollers which are used to support the test sample. For decreasing friction between the rollers and the molding compound layer of the test sample, two rollers are allowed to rotate freely. Silicon lubricant grease is used in bearings for withstanding the high temperature effects. The third part is the loading head which applies displacement or loading to the sample.

u p p e r s pau

p ins

g

i

A pp lied lo ad

n

Fig.5 Schemat ic overview offour p oint bending test setup

Fig.6 Four bending tool setup

2.3 Loading system and optical system

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Fig.8 Initial state ofthe notch

Fig.9Initial molding comp ound crack

When the load head touches the test sample, the test sample deforms and the response is elastic (see Fig. 12). The applied load increases with the displacement and the load

gradually reaches the highest point. At some critical

displacement, the load suddenly drops. The EMC notch cracks and penetrates through the molding compound towards the interface, as shown in Fi .9.

Fig.7Displacemen t/loading and optical system

Fig. 7 shows the universal tester Zwick/Roell Z005. Loading head moves downwards in IOOum/min and reaction force of the loading head is measured by the force sensor when loading head touches the sample. A Keyence optical camera system is mounted at the back of the bending tool, see Fig. 6. The optical camera focuses on the notch and monitors the deformation and delamination between die attach and copper.

3. Four Point Bending Test Results

3.1. Fourpoint bendingtest crack and delamination processes

In order to obtain more reliable interface toughness properties, four point bending tests are performed at different temperatures. Fig.8 to Fig.ll visualizes the typical procedures of four point bending tests, from start of the delamination to delamination propagation. Fig. 12 shows the relation between displacement and loading. Loading speed is O.lmm/min and it appears that the loading speed has no effects on the "allowable load" according to our tests at room temperature.

The initial state of the three layers before loading is shown in Fig. 8. The three layers are leadframe, glue and EMC from top to bottom layers respectively. The thickness of glue layer, approximately 58!1m in thickness, is uniformly distributed between copper and molding compound layer using controlled stencil foil.

Fig. 10 initial delamination

After that, the crack penetrates through the glue layer very quickly and reaches the interface between glue and copper, (see Fig. 10). The load will continue to increase until interface delamination starts on both sides see Fig. 11. Finally the load begins to decrease, see Fig. 12.

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Fig.11 Delamination propagation

When this load starts to decrease , the delamination starts. After the delaminations at both sides have started, the crack propagation load "stabilizes" around a constant value. From this constant allowable load, the interface fracture toughness value is derived with the aid of the results of numerical simulations (see 3.3).

saturation. Four point bending tests are performed at room temperature and 85°C respectively after this pre conditioning.

- s-14-RT - s -19-RT - s -33-RT - s-37-RT 400 500 600 700 600 900 dlsp [urn]

Fig13. Response offour point bending at room temperature

1200 1000 s -32-150C - s -29-150C - s -3Q-150C - s -28-150C 400 600 800 disp rum] 200 o o 0.5 1.5 2.51 I - . · ' J· RT I

Delaminat ion st art

Stable delamination propagat i n

/

delam ination evolut ion / '

'-1-- - - -- +

Ef\1C crack Glue deforma t ion

. ~ !

:100 1000 1:1001400 1fol1O 11100 ;>000

,zp 1"'1

Fig.12 Relation between displa cement and load

Fig14. Response offour p oint bending at 150"C

3.1. Test result at different temperatures ofdry samples

Fig.13 shows response for four repetitive tests at room temperature. The stable crack propagation force is reproducible within error about O.IN. Other tests were performed at 40, 60, 85 and 150°C respectively. Detail test results at 150°C are shown in Fig.14. Fig. 15 shows the response of four point bending at different temperatures and these results show that temperature has a great effects on the critical crack propagation load. This means that the interface toughness decreases with increasing temperature.

s -33-RT - s -39~OC - s -24-85C - s -28-150C l ' / 1....-- -- --

-o,V

,

' , ,

o 100 200 300 400 500 600 700 800 900 1000 disp (urn]

3.2. Four Point Bending Test results ofPRECON Samples

In order to investigate moisture effects on interface toughness, test samples are put in humidity oven at 85°C/85%RH for at least 48 hours in order to reach moisture

Fig15.Response offour point bending at different temperatures

Table I shows the average crack propagation load for both dry and pre-conditioned samples . Test results show that the average crack propagate load of the pre conditioned sample at

4

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(2) (5) (3) (4) (6) Bottom support Top load=P/2 Symmetry dx •E I

================~=======:::=J

Symmetry 4PB

in whichG;is the interface toughness ande= 2.718 [8]. Top edge

Node~e 3

Node~2

Bottom edge

Fig.172D Interface element

The traction t is introduced as function of effective opening displacement and is characterized by an initial reversible response , followed by an irreversible response once the critical effective opening displacement Ve has been

reached .Anexponential function is used in the simulation . specimen is modeled. Top layer is copper and bottom layer is EMC. Vertical displacements fixed at the bottom support (see arrow bottom supports) is the boundary condition . Top load applies a loading in downwards direction . Symmetry_dx fixes displacement of all symmetric nodes in horizontal direction . Thermal deformation is considered here. Symmetry_4PB fixes displacement of only symmetric nodes of copper layer in horizontal direction see Fig. 16.Aninitial crack is made in the model at the center of the EMC and die attach.

Four stages are prescribed in the simulation model including initial thermal stresses. The first stage is cooling down from the initial condition 175°C. Temperature is cooled from 175°C to room temperature using boundary conditions at bottom support and symmetry_dx. The second stage is the heating up. Temperature is increased from room temperature to the test temperature using boundary conditions bottom support and symmery_dx. The third stage is the relaxation . Temperature is kept at the test temperature using the boundary conditions of bottom support and symmetry_dx. The last one is four point bending stage. Temperature is kept at test temperature and other boundary conditions are bottom support, top load and symmetry_4PB. Top load is the downwards displacement applied to the sample. Symmery_dx fixes all nodes in x direction at the symmetry line while symmetry_4PB fixes only nodes on copper in x direction as shown in Fig. 16.

Fig.162D four point bending FE model 3.3 3 Cohesive zone element

Marc has a library of interface elements, which can be used to simulate the onset and propagation of delamination. The constitutive behavior of these elements is expressed in the terms of tractions versus relative displacements between the top and bottom edge/surface of the elements, as shown in the Fig.I7.

3.3.2 Numerical model

In addition to the analytical model, the interface toughness Ge can be obtained by changing the G; value until crack

propagation load equals the experimental propagation load. A four point bending model is constructed in the finite element package Marc and its graphical user interface Mentat (see Fig.16). Due to the symmetry of the model, only half a 3.3. Calculation ofinterface toughness

room temperature is almost the same as that of the drysample tested at room temperature. The average crack propagate load of the pre-conditioning sample tested at 85°C is also almost the same as that of the dry sample tested at 85°C. This means that moisture has no effects on the interface toughness between the die attach and copper leadframe .

3.3.1 Analytical model

The critical interface fracture toughness , G; can be deduced analytically by recognizing that it is simply the difference in the strain energy in the uncracked and cracked beam. Since there is negligible strain energy in the beam above the crack, G;can be deduced from the consideration of energies in the uncracked section, and the lower section below the crack. Using the Euler-Bernoulli theory and plane strain conditions, these energies can be expressed in terms of the applied momentM as [7]

U

=

(l_v

2)M 2/ 2£ / (1) where Uis the strain energy per unit cross-section andI is the second moment of area per unit width, Gecan then derived

into (2)

o;

=

M2(I-Vn(J..._~J

2E2 12 I e

where 12 and Ie are second moment of inertia per unit

cross-sectional area for the bottom layer and the composite beam, respectively, and

4

=E2

(1-

VIZ ) /E1

(1 -

vi )

I 3

12

=12

h 2

I

=J.-

h3+.3:.h3

+

4h\h z(h\ +hzY

c 12 \ 12 z 4(~

+

4hJ

The subscript 1 indicates quantities relevant to the top layer, whereas the subscript 2 denotes the corresponding quantities for the bottom layer. Subscript c refers to the composite beam. Note that the moment per unit width M=

PI/2B , with P being the constant load and I the spacing

between inner and outer span. According to Eq. (2) analytical

G; can be obtained. This G; value can be used initially to estimate crack propagation load in the simulation model, (see Table 1), temperature effects on young's modules are roughly considered in analytical equation (2).

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Fig.18Fitted load by chang ing Ge

200 150

100

temp(0C)

-+-

Ana lytica l Eq(2) Dry

____ Simu Dry 6 PRECON85085%RH 50 30.0 25.0 N 20.0 < ~ 15.0 :::;. o o 10.0 5.0 0.0 0

Interface toughness and critical opening are two important material properties for simulation. In order to extract critical opening from sample delamination, a special optical camera system is installed combined with universal tester Zwick.

Fig.19 Temperature and moisture effects on G; value

3.3. Determination of the interf ace critical opening

Fig. 20 Delamination test with camera setup

Table 1 shows the crack propagation load, G; values of equation (2) and simulation. From Fig. 19, it can be seen that these two curves fit well. It can be seen that G; value decreases rapidly with increasing temperature. As already discussed , tests results show that in our case, moisture has no effects on Gcvalue. (9) _ _ 25C - - 60C - . - 85C 0.2 OA O ~ 0.8 di s pla cem ent [m m]

4.5 4 3.5 3 ;[ 2.5 "0 ctl 2 52 1.5 1 0.5 0 0

Table 1G;value of Equation and Simulat ion

It can easily be verified that the maximum effective traction te, corresponding to the critical effecti ve opening

displacementVeis given by [8,9] :

t

=~

(7)

e

e Ve

If the maximum effective traction is known , the critical or effect ive opening displacement can be determined by:

G

v = _e (8)

e etc

Damage is defined as:

[' tdv

D=_c_

[tdv

c

Ve< Vs

IfD=1, the element is fully damaged .

G;is obtained from 4 point bending tests combined with simulation of the fitted crack propagation load.G; values from analytical equation is input as initial value . By adjusting theG; value until simulation load equals to measured load, the actual

G;can be found (see simulation results in Fig. 18).

Fig. 18 shows some typical four point bending simulation results at different temperatures. In this simulation, the relationship between applied displacement and load are shown in this figure. The mesh size is chosen such that convergence of the results is obtained.

Temp Load(N) G,(J/m2

)

("C) Dry PRECON Eq. (2) Dry Simulation 85°C/85%RH 23 4.1 4.0 27.2 26.5 40 2.75 12.2 13 60 2.1 7.1 8 85 1.7 1.76 4.7 5.6 150 0.71 3.0 1.9

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The Keyence optical camera system is placed at the back of the four point bending tool frame and focuses on the notch, especially the range of the interface delamination. Camera can be manually adjusted vertically in order to follow the movement of the sample due to the loading applied to the sample, see the C direction in Fig. 20. Focus can be performed by the rough and fine adjustment provided by the Keyence optical camera system, see B and A knobs respectively. Knob D can be used to adjust the angle around its shaft to ensure that the delamination front is in the center of the image. A series of particular pictures were taken, especially when the delamination was visible and delamination propagated.

In [10], critical opening is determined by the local deformation around the crack tip in the samples. This will provide a guide for conducting experiment and deduce the parameters needed to be measured.

Fig. 21 shows simulation result of delamination length, (indicated by length E), which is dependent on the values of critical opening. When damage value reaches I at interface

nodes, delamination occurs.

Fig.21 Simulation result of delamination ; contour bands denote the

damage value D

Fig. 22 is an enlargement of Fig. 21, which shows another delamination parameter, the interface opening at the symmetry line This length between M and N in vertical direction is

independent of critical opening values according to

simulations. Combining Fig. 21 and Fig. 22, curves with different critical value ranges can be determined.

1 . 0 0 0 e +0 0 9 .000 - 0 1 8 .000 - 0 1 6 .000e-01 5 . 00 0 - 0 1 4 . 0 0 0 - 0 1 3 .000 e -0 1 2 .000 e -01

Fig.22 The interface opening at symmetry line

-7-3.3.1 Test results ofdelamination measurements

The test procedures for this part of experiment is the same as in section 3.1 with the exception of the displacement speed of clamp head of four bending tool. This loading speed is decreased from 100 to 50pm/min in order to take more pictures. The displacement speed has no effect on measured critical delamination force applied to the specimen.

Fig. 23 shows one of the delamination pictures including the measured dimensions. If the delaminations lengths are not equal at both sides of the specimen, half of the total length measured is assumed to be the delamination length one side. And MN is measured at the centre of the total delamination length, see Fig. 24.

Fig.23 Delamination measurements

Fig.24 Non symmetric delamination measurement

Due to the higher interface toughness of the glue, about 5 times higher than that of interface toughness between copper leadframe and molding compound, it is sometimes difficult to obtain equal delamination length at both sides of the

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4. Conclusion

From a series of four points bending tests, it is found that temperature has a large effect on the interface toughness. G;

value greatly decreases with increasing temperature. In addition , moisture has no effects on interface toughness of copper and die attach in our samples.

Using results from both experiment tests and cohesive zone simulation method, critical opening is found between 0.5 to 1.0!Jll1 at room temperature. Critical opening values will decrease with temperature increasing according to model [8].

These two important interface properties can be used in the future to predict the possibility of delamination in the microelectronic packages.

specimen. The pre-crack location will sometimes result in unequal delamination length at both sides of samples. Therefore , a small v-shape pre-crack is made inside the larger U shape pre-crack in order to ensure better results . In Fig. 25, scattered dots with different shapes are results from different specimen . However, same shape dots at different locations are the results from the same specimen but from different delamination lengths as the delamination propagates.

The two curves are simulation results using different critical opening values . It is evident that the delamination length increases with increasing vertical delamination MN. All test results from the tests fall between the two simulation curves with critical opening values from 0.5 to 1.0urn. From these fits between simulations and experiment, it turns out that critical opening value is between 0.5 and 1.0!1m at room temperature.

Fig.25 Comparison

0/

results between tests and simulations

Composite Materials: Current Status," Applied Composite Materials, Vol. 5, No.6 (1998), pp. 345-364.

[2] Hashemi, S., Kinloch , A. J., and Williams , J. G., "Corrections needed in double-cantilever beam tests for assessing the interlaminar failure of fibre-composites," J. Mat. Sci. Letter 8 (1989), pp. 125-129.

[3] Hashemi, S., Kinloch, A J., and Williams, J. G., "The Analysis of Interlaminar Fracture in Uniaxial Fibre-Polymer," Proc. Royal Soc. A427 (1990), pp. 173-199. [4] Hojo, M., Kageyama , K. and Tanaka, K.,

"Pre-Standardization Study on Mode I Interlaminar Fracture

Toughness Test for CFRP," Japan

Composites , Vol. 26, No.4 (1995) , pp. 243-255.

[5] Crews, J. H. and Reeder , 1. R., "A Mixed-Mode Bending Apparatus for DelaminationTesting," NASA TM 100662, 1988

[6] Reeder, J. R. and Crew, J. H., "Nonlinear Analysis and Redesign of the Mixed-Mode Bending Delamination Test," NASA TM 102777, 1991

[7] Charalambides, P.G., "A Test Specimen for Determining the Fracture Resistance of Bimaterial Interface," J. Appl. Mech., Vol. 56 (1989), pp. 77-82.

[8] MSC.Marc/Mentat, volue A, 2008 r 1, 2008

[9] M.Ortiz and A. Pandolfi , "Finite-Deformation irreversible cohesive elements for three dimensional crack-propagation analysis, International Journal for numerical methods in engineering," Vol. 44 (1999), pp.1267-1282.

[10] O. van der Sluis, P.H.M. Timmermans , E.J.L. van der Zanden, J.P.M. Hoefnagels. Analysis of the three-dimensional delamination behavior of stretchable electronics applications. In M.H. Aliabadi,S . Abela, S. Baragetti, M. Guagliano , and H-S. Lee, editors, Key Engineering Materials, volume 417-418, pages 9-12. Trans Tech Publications, 2010 . Special volume: Advances in Fracture and Damage Mechanics VIII, ISSN 1013-9826

4 0 35 30 o Test sample_1 o Test sample_2 t; Test sample_3 o Test sample_4 o Test sample_5 - Simulation Vc=O.5um - Simulation Vc=1.0um o 15 20 2 5

MNin y di rect ion (IJm ]

o 10 o 900 800 E 2- 700 c 0 U 600 l" 'U x 500 c :; g> 400 .!!! c

~

300 .~ 200 0; 0 100 0 0 Acknowledgement:

Thanks to D.G.Yang and Jeroen Zaal for the assistance with the sample making. And thanks to Harry Janssen, Patrick Holst and Rob Luttjeboer for the construction of the test setup.

References

[1] Davies, P., Blackman , B.R.K., and Brunner, AJ., "Standard Test Methods for Delamination Resistance of

8

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