Calibration of current-steering D/A Converters
Citation for published version (APA):
Radulov, G. I., Quinn, P. J., Hegt, J. A., & Roermund, van, A. H. M. (2009). Calibration of current-steering D/A Converters. In Proceedings of Analog/Mixed-signal Innovation Network "Digitally Assisted Analogue", 22nd October 2009, Dublin, Ireland (pp. 1-26)
Document status and date: Published: 01/01/2009 Document Version:
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Calibration of Current Steering
Calibration of Current Steering
D/A Converters
D/A Converters
ir. Georgi Radulov
1
, dr. ir. Patrick Quinn
2
, dr. ir. Hans Hegt
1
,
prof. dr. ir. Arthur van Roermund
1
1
Eindhoven University of Technology
Current-steering D/A converters
Applications demand performance;
Applications demand performance;
Errors
limit performance;
Small errors demand huge resources.
Correction methods:
Improve performance and
Relax design requirements
Overview
• Mismatch problem;
• Current calibration method;
• MSB unary currents calibration in a 12b 250nm DAC
• All (MSB unary and LSB binary) currents calibration in a
quad-core 12b 180nm DAC;
• All currents calibration in a 12b-16b flexible 40nm DAC
• Conclusions
Mismatch problem
• Elements’ real values
deviate
• Deviation
depends on:
– Area
– Tech. and Circuit parameters
• High resolution D/A require
I
PDF(I)
II
MEAN2
K
σ
∼
4
• High resolution D/A require
– Many and accurate elements
– Large silicon areas
• Large silicon areas
cause
– Systematic errors
– Drop of performance
(
)
I
I
K
W
L
I
σ
~
∼
×
max
I
INL
I
n
⋅
σ
∼
~
I
offset1-bit
ADC
φ
φ
φ
φA: open
φ
φ
φ
φA: closed
FSM
Start-up calibration scheme
• Mismatch correction;
• Input offset cancellation;
• Two phases: φA, φB;
ADC
I
tempI
refI
th(i)
temp
CALDAC
CALDAC(i)
φ
φ
φ
φA: open
φ
φ
φ
φB: closed
φ
φ
φ
φA: closed
φ
φ
φ
φB: open
φA: I
temp
=I
ref
- I
offset
;
φB: I
th
(i)=I
temp
+ I
offset
=I
ref
;
with I
ref
=ΣI
bin
+ I
LSB
;
12bit self-calibrating DAC in 250nm CMOS,
• 12b current-steering DAC;
• Segmentation: 6LSB/
6MSB
;
• 63 thermo bits calibrated;
12bit DAC implementation
• 6 binary not calibrated;
• Reference: binary bits;
• 5bit signed CALDACs;
• CMOS 0.25µm; Vdd 2.5V.
Chip micrograph
Latches
&
Decoder
Latches
&
Decoder
Input
drivers
• CMOS 0.25µm, 1P5M;
• Coarse (main) current
sources designed for 10b
accuracy in 0.1mm
2
;
1.16mm
Coarse current sources
Array of CALDACs
FSM & 1bit ADC
Decoder
Decoder
accuracy in 0.1mm ;
• Fully integrated
self-calibration in 0.3mm
2
;
• 5 extra pads for calibration:
4 in & 1 out;
8
Cascodes M2, M3a, M3b
0
.9
8
m
m
Self-calibration of MSB unary currents
measurements
SFDR = 81dB
SFDR = 68dB
9
Self-calibration of MSB unary currents
measurements
HD (2,3,4,5)
(max) improvement +18dB
SFDR
improvement +13dB
10
Calibration potential
Distribution before calibration
• 3.5 LSB span,
σ
=1.06LSB;
• Tech. and design tolerances;
Distribution after calibration
• 0.2 LSB span,
σ
=0.03LSB;
• Calibration step sets the span;
technische universiteit eindhoven
Unary
currents:
-1.5 -1 -0.5 0 0.5 1 1.5 2 IN L [ L S B ] 2
• MSB unary part
dominate;
• INL
max
= 1.5LSB;
Before
10b
Static performance
INL:
-2 0 500 1000 1500 2000 2500 3000 3500 4000 Digital code -2 -1.5 -1 -0.5 0 0.5 1 1.5 2 0 500 1000 1500 2000 2500 3000 3500 4000 IN L [ L S B ] Digital codeAfter
12b
• LSB non-calibrated
binary part dominate;
• INL
max
= 0.4LSB
12
technische universiteit eindhoven
INL:
+2b
Calibration of binary currents
Binary
no redundancy
New sub-DAC segmentation (M binary sets)
redundancy
_ _ 1 _ 1 1 _ 1 _( )(1)
( )(2)
( )(
1 :
( )(1) 1
:
2 :
( )(1) 1
:
1)
( )(2
:
)
:
3
ref bn ref bn B bin ref u i I B bin ref u bin bin b i I ref b n u in iI
i
LSB
I
I
i
LSB
I
I
I
B
I
B
I
B
I
B
− = − =+
+
=
+
+
=
+
=
∑
∑
13
equal
1/2
12b-14b self-calibrating flexible DAC in
180nm CMOS,
180nm CMOS,
Parallel sub-DAC units architecture
Current-steering DACs:
Parallel current sources (switch current cells),
which are switched in groups to create the
analog output;
a) Unary (Thermometer) grouping;
technische universiteit eindhoven
b) Binary grouping;
c) Segmented grouping;
d) Our NEW grouping: parallel sub-DACs
(with an exemplary implementation).
A 12-bit self-calibrated quad-core
current-steering DAC
recall:
1mm
2
f
or the
presented 12b DAC
(250nm CMOS)
16
0,2mm
2
per 12b DAC
(180nm CMOS)
(250nm CMOS)
-Large LSB binary part;
-Full calibration.
Calibration of unary and binary currents,
measurements
Before calibration
After calibration
INL
17
Before calibration
After calibration
Calibration of all DAC currents,
measurements
DAC accuracy depends only on a design parameter
Calibration of all DAC currents,
dynamic measurements
SFDR = 80dB
19
12b-16b self-calibrating flexible DAC in
40nm CMOS,
40nm CMOS,
A 12b-16b self-calibrated flexible DAC in 40nm CMOS
Analog output
Construction of the full transfer characteristic
Off-chip
calibration
engine;
Flexibility;
A B C D E F G H I J K L M N O P A B C D E F G H I J K L M N O A B C D E F G H I J K L M N A B C D E F G H I J K L M A B C D E F G H I J K L A B C D E F G H I J K A B C D E F G H I J A B C D E F G H I A B C D E F G H A B C D E F G A B C D E F A B C D E A B C D A B C A B A B C DE F G HI J KL MN O P C DE F G HI J KL MN O P DE F G HI J KL MN O P EF G HI J KL MN OP F G HI J K L MN O P G HI J K L MN OP HI J K L MN OP I J K L MN OP J KL MN O P KL MN O P L MN O P MN OP NO P OP PBOLD - sub-DACs set to full-scale ‘1’.
Italic - sub-DACs convert the12 LSB input data;
Narrow gray - sub-DACs set to full-scale ‘0’;
Digital input
Analog output
Construction of the full transfer characteristic
12b output 12b output 14b output 13b output 15b output