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Calibration of current-steering D/A Converters

Citation for published version (APA):

Radulov, G. I., Quinn, P. J., Hegt, J. A., & Roermund, van, A. H. M. (2009). Calibration of current-steering D/A Converters. In Proceedings of Analog/Mixed-signal Innovation Network "Digitally Assisted Analogue", 22nd October 2009, Dublin, Ireland (pp. 1-26)

Document status and date: Published: 01/01/2009 Document Version:

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(2)

Calibration of Current Steering

Calibration of Current Steering

D/A Converters

D/A Converters

ir. Georgi Radulov

1

, dr. ir. Patrick Quinn

2

, dr. ir. Hans Hegt

1

,

prof. dr. ir. Arthur van Roermund

1

1

Eindhoven University of Technology

(3)

Current-steering D/A converters

Applications demand performance;

Applications demand performance;

Errors

limit performance;

Small errors demand huge resources.

Correction methods:

Improve performance and

Relax design requirements

(4)

Overview

• Mismatch problem;

• Current calibration method;

• MSB unary currents calibration in a 12b 250nm DAC

• All (MSB unary and LSB binary) currents calibration in a

quad-core 12b 180nm DAC;

• All currents calibration in a 12b-16b flexible 40nm DAC

• Conclusions

(5)

Mismatch problem

• Elements’ real values

deviate

• Deviation

depends on:

– Area

– Tech. and Circuit parameters

• High resolution D/A require

I

PDF(I)

I

I

MEAN

2

K

σ

4

• High resolution D/A require

– Many and accurate elements

– Large silicon areas

• Large silicon areas

cause

– Systematic errors

– Drop of performance

(

)

I

I

K

W

L

I

σ

~

×

max

I

INL

I

n

σ

~

(6)

I

offset

1-bit

ADC

φ

φ

φ

φA: open

φ

φ

φ

φA: closed

FSM

Start-up calibration scheme

• Mismatch correction;

• Input offset cancellation;

• Two phases: φA, φB;

ADC

I

temp

I

ref

I

th

(i)

temp

CALDAC

CALDAC(i)

φ

φ

φ

φA: open

φ

φ

φ

φB: closed

φ

φ

φ

φA: closed

φ

φ

φ

φB: open

φA: I

temp

=I

ref

- I

offset

;

φB: I

th

(i)=I

temp

+ I

offset

=I

ref

;

with I

ref

=ΣI

bin

+ I

LSB

;

(7)

12bit self-calibrating DAC in 250nm CMOS,

(8)

• 12b current-steering DAC;

• Segmentation: 6LSB/

6MSB

;

• 63 thermo bits calibrated;

12bit DAC implementation

• 6 binary not calibrated;

• Reference: binary bits;

• 5bit signed CALDACs;

• CMOS 0.25µm; Vdd 2.5V.

(9)

Chip micrograph

Latches

&

Decoder

Latches

&

Decoder

Input

drivers

• CMOS 0.25µm, 1P5M;

• Coarse (main) current

sources designed for 10b

accuracy in 0.1mm

2

;

1.16mm

Coarse current sources

Array of CALDACs

FSM & 1bit ADC

Decoder

Decoder

accuracy in 0.1mm ;

• Fully integrated

self-calibration in 0.3mm

2

;

• 5 extra pads for calibration:

4 in & 1 out;

8

Cascodes M2, M3a, M3b

0

.9

8

m

m

(10)

Self-calibration of MSB unary currents

measurements

SFDR = 81dB

SFDR = 68dB

9

(11)

Self-calibration of MSB unary currents

measurements

HD (2,3,4,5)

(max) improvement +18dB

SFDR

improvement +13dB

10

(12)

Calibration potential

Distribution before calibration

• 3.5 LSB span,

σ

=1.06LSB;

• Tech. and design tolerances;

Distribution after calibration

• 0.2 LSB span,

σ

=0.03LSB;

• Calibration step sets the span;

technische universiteit eindhoven

Unary

currents:

(13)

-1.5 -1 -0.5 0 0.5 1 1.5 2 IN L [ L S B ] 2

• MSB unary part

dominate;

• INL

max

= 1.5LSB;

Before

10b

Static performance

INL:

-2 0 500 1000 1500 2000 2500 3000 3500 4000 Digital code -2 -1.5 -1 -0.5 0 0.5 1 1.5 2 0 500 1000 1500 2000 2500 3000 3500 4000 IN L [ L S B ] Digital code

After

12b

• LSB non-calibrated

binary part dominate;

• INL

max

= 0.4LSB

12

technische universiteit eindhoven

INL:

+2b

(14)

Calibration of binary currents

Binary

 no redundancy

New sub-DAC segmentation (M binary sets)



redundancy

_ _ 1 _ 1 1 _ 1 _

( )(1)

( )(2)

( )(

1 :

( )(1) 1

:

2 :

( )(1) 1

:

1)

( )(2

:

)

:

3

ref bn ref bn B bin ref u i I B bin ref u bin bin b i I ref b n u in i

I

i

LSB

I

I

i

LSB

I

I

I

B

I

B

I

B

I

B

− = − =

+

+

=

+

+

=

+

=



















13

equal

1/2

(15)

12b-14b self-calibrating flexible DAC in

180nm CMOS,

180nm CMOS,

(16)

Parallel sub-DAC units architecture

Current-steering DACs:

Parallel current sources (switch current cells),

which are switched in groups to create the

analog output;

a) Unary (Thermometer) grouping;

technische universiteit eindhoven

b) Binary grouping;

c) Segmented grouping;

d) Our NEW grouping: parallel sub-DACs

(with an exemplary implementation).

(17)

A 12-bit self-calibrated quad-core

current-steering DAC

recall:

1mm

2

f

or the

presented 12b DAC

(250nm CMOS)

16

0,2mm

2

per 12b DAC

(180nm CMOS)

(250nm CMOS)

-Large LSB binary part;

-Full calibration.

(18)

Calibration of unary and binary currents,

measurements

Before calibration

After calibration

INL

17

Before calibration

After calibration

(19)

Calibration of all DAC currents,

measurements

DAC accuracy depends only on a design parameter

(20)

Calibration of all DAC currents,

dynamic measurements

SFDR = 80dB

19

(21)

12b-16b self-calibrating flexible DAC in

40nm CMOS,

40nm CMOS,

(22)

A 12b-16b self-calibrated flexible DAC in 40nm CMOS

Analog output

Construction of the full transfer characteristic

Off-chip

calibration

engine;

Flexibility;

A B C D E F G H I J K L M N O P A B C D E F G H I J K L M N O A B C D E F G H I J K L M N A B C D E F G H I J K L M A B C D E F G H I J K L A B C D E F G H I J K A B C D E F G H I J A B C D E F G H I A B C D E F G H A B C D E F G A B C D E F A B C D E A B C D A B C A B A B C DE F G HI J KL MN O P C DE F G HI J KL MN O P DE F G HI J KL MN O P EF G HI J KL MN OP F G HI J K L MN O P G HI J K L MN OP HI J K L MN OP I J K L MN OP J KL MN O P KL MN O P L MN O P MN OP NO P OP P

BOLD - sub-DACs set to full-scale ‘1’.

Italic - sub-DACs convert the12 LSB input data;

Narrow gray - sub-DACs set to full-scale ‘0’;

Digital input

Analog output

Construction of the full transfer characteristic

12b output 12b output 14b output 13b output 15b output

0.047mm

2

per

12b sub-DAC

(recall:

1mm

2

for 250nm;

0.2mm

2

for

180nm)

(23)

+5 bits

Calibration of all DAC currents,

INL & slow signals measurements

Before:

SFDR = 59dB

After:

SFDR = 79dB

+4 bits

Before:

SFDR = 63dB

After:

SFDR = 80dB

(24)

Calibration of all DAC currents,

dynamic measurements

(25)

Conclusions

• Calibration:

– improves performance;

– relaxes design requirements;

– reduces product risks;

• 3 test-chip demonstrated:

– aggressive analog area reduction;

– high current accuracy;

(26)

Acknowledgements

Xilinx

Ireland, Mixed-Signal Design Group

25

Xilinx

Ireland, Mixed-Signal Design Group

(27)

Thanks for attention!

26

Discussion

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