Multiphase diffusion in some related ternary metal systems
Citation for published version (APA):
Loo, van, F. J. J., & Bastin, G. F. (1983). Multiphase diffusion in some related ternary metal systems. In F. J. Kedves, & D. L. Beke (Eds.), Diffusion in metals and alloys : international conference, 1982, Tihany, Hungaria: proceedings (pp. 580-592). (Diffusion and Defect Monograph Series; Vol. 7). Trans Tech Publications.
Document status and date: Published: 01/01/1983
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MULTIPHASE DIFFUSICN
m
SCME REIATED TERNARY MErAL SYSTEMS. F.J.J. van IDo and G.F. BastinEindhoven University of Tec1mology,
Ialx:>rato:ry of Physica.l Chemi.stry, Eindhoven, '!he Netherlands.
Intrcx1uction
Recently the authors have published their results of investigations into nultiphasè diffusion phenarena in the systen1s Ti-Ni-CU [1],
Ti-Ni-Fe [2] and Ti-Ni~[3]. Especially the product layer norphology in these diffusion couples in which a TiNi
3-like phase was fonred
~ te he ve:ry interesting. '1herefore, a systematie investigaticn
was started in order to carpare the resulting m:>rphologies in couples of the type TiNi
xMe1_x versus NiyMe1-y in which TiNi3-like phases are
expected to occur (the syni:x:>l Me represents ene of the elemants Cu, Fe or Co). Fran a fundanental as weIl as fran an experinental point of view i t appeared to he advantageous te annea.l the couples at ene fixed taIperature, Le. 900oC. It was, therefore, necessa:ry te
detennine the 9000C cross-section through the Ti-Ni
-cu
phase diagram since in earlier investigations this was dane by us only at 800 and8700C [1].
'!he experilrental procedure
For the detenni.naticn of the 9000C isothenn of the Ti-Ni-CU system as weIl as for the use as a tenni.nal material in diffusicn
eooples, alloys have been prepared by repeatecl. argon are nelting. After nelting they wem hatDgeni.sed for at least 100 hours at 9000C in
sealed evacuatecl. silica capsules. As reported by Zwicker et al. [4] the
nelting point of binary Ti
-cu
alloys is ve:ry nuch influenced by traces of oxygen • '1herefore, in order to prevent axygeh contamination as a result of direct contact between the alloy and the silica capsule sare alloyswere
wrélfPed
in titanium sheet.Diffusion couples were made in a special furnace in which three slices of the tenni.nal alloys were hot-pressed as a sandwich by rreans
of a set of wei.ghts for 70 te 150 hoors at 9000
e
in a vacuum better than10-5 Torr. After diffusian annealing the cooples were eniJedded, ground
and polished parallel te the diffusion direction and, if
necessary,
etched with a mixture of 10% ~02' 5%HF and 85% ~O.
'llie alloys and oouples were then investigated by cptical microscqJy
using polarised light, by X-ray diffractien and by micrt\'robe analysis
using a Jeol Superprobe 733 [3].
'!he detennination of the 9000
e
isotherm of the Ti-Ni-euJ;ilase
diagram
In Table 1 a nt.miJer of equilibrated alloys are given together
with the
Ifuises
which were·found. '!he presence of a liquidFhase
in the Ti~-regialmade the detennination of that part of the isotherm rather difficult. 0Ur results are in l.ine with the phase diagram of the binaryTi
-cu
system as given by let>ffat [5].In fig. 1 the resulting isotherm is given.
Table 1.
Phases present in Ti-Ni-eu alloys equilibrated at 900o
e.
For the designation of theFhases see
Fig. 1.Alloy ca!J?C?Sition
TiCu4 , TiCu2 and Ti2~ Ti25Ni50~5 Ti31Ni8Cu61 Ti33Ni7Cu6Ó Ti33Ni9Cu58 Ti33Ni
n
Cus6 Ti33Ni13Cu54 Ti34Nill.5Cl1s4.5 Ti34Ni54.5CUll.S Ti38Ni8CUS4 Ti39Ni4Cu57 Ti44Ni7Cu49 Ti60Ni23Cu17 Ti7SNiI2.SCUI2.S Phases present Melting phenatenae
E+
nrri2~JI E E E+O D D+-E+"~~n DiJI'iNi 3+TiNi D+-''Ti2--jCL"+Ti Cu3 4 E+"Ti2~" TiNi+Ti 3Cu4 TiNi+Ti~i+Ti2Cu (3.JI'i+Ti 2Ni+Ti2Cup
-Ti
Ni
Fig. 1. The 9000C isotherm of the Ti-Ni-Cu phase diagram.
Results of the diffusion couple experlltents
In figs. 2, 3 and 4 our results·en diffusicn couples are sh,a,m
in a qualitative Wér;/. 'llle thicknesses of the product layers are
nonnali-sed for an armealing ti1te of 100 hours by nultiplying the actua1
thicknesses by a factor
(IOO/t)~,
where t = annealing tine in hours. For a m.mber of couples the parabolic gr<:Mt:h behaviour bas been verified.Ni
~
~4-~_
- -
:i.:F~i:f..i.·f·f=i.·i:t:t.i.·2»))}))}})l!
:)·:14)x:wX',:)(:':x.1::%..i.~.-Cu
melting
phenomena
o
znm
E
rnmn
C
~ A sO).Jm583
Fig. 2. Survey of the morphologies and thicknesses of the reaction
layers in Ti-Ni-Cu diffusion couples after annealing 100 hours
at 900
0C
Ni
-N"
F'o 180, 20•
...
-Ni Fe
50 5 -...,...LI;f~?J~~it{.~fi~ï4..~,;.;.".'.~.:
- ...:.:.::.~.~
..,:.~
..~,.:~.:.:.~~.:.:.:~.J.:~.;
..~~.:-.:.~:,~.'.:.;u.:';
~_ ili'tW{-;··';\TiFe
2 sO}JmFig. 3. Survey of the morphologies and thicknesses of the reaction
layers in Ti-Ni-Fe diffusion couples after annealing
100
hours
at
900
oC.
Ti
so
CO
so
Ni
Co
_
ill:!lfS'à
mrrm
~ ~ 4 •TiCo
2Chex)
TiCo
2(cub)
TiCo3
TiCN!5C~S)3TiNi3
s0J,JmFig.
4. Survey of the morphologies and thicknesses of the reaction
layers
in
Ti-Ni -Co diffusion couples after anneal ing
100
hours
at
900oC.
product noqilology in each of the 15 diffusion couples investigated in the Ti-Ni
-cu
system. '1be TiNixCul_x tenni..nal alloy is always the
upper part, whereas NiyCul-y is the bottan part in eachdrawing. In these
schelres no infonration can be found conoeming the concentration gradients existing in the various phases. In all couples these have been det:enni.ned by micrcprcbe analysis, but in the franework of this article al1y two exanples are shewn in Fig. S,a and b. Especially in
the TiNi te:cninal alloy a large zene is found in which the concentration
of the variOJS elem:mts gradually change, in contradiction te the al-ways steep concentraticn gradients in all ether te:rm:inal allays. Typical
for these systems is the maxilrurn in the Ti concentration profile in
the NiOl tenninal alloy, and the max:i.nml in the Ni concentration profile
in the TiNi tenni..nal alloy in couples of the type TiNi-NiyFel-y and
TiNi-Ni Col •
Y
-yIn the Figs. 6, 7 and 8 a nunber of diffusion paths is presented on the respective i.sotherins.
In all types of couples 'the original welding interfaoo (Kirkendall
interface) was found
near
the Nil'fel-y tenninal alloyas indicated
by the arrov1 in Figs. 2, 3 and 4.
Evaluaticn of the exper:inental results
In each vertical colmn in Figs. 2, 3 and 4 a clear relatioo can
be found conoeming the variOJS no~ologiesand thicknesses of the
product layeri;. In the harizontal rCMS this relation is also present althcugh less prona.mced.
'1be lOOSt interesting point for us is the questicn why in certain
oouples ene ar nore interfaces are no longer' straight and becare
serrated.
In all three systems this ~cnencnoccurs,
but clearlynot in the sane way. '1lle kind of pertw:baticn is also different: the
needles of the TiNi
3 I;t1ase, protruding into Ni/,el-y' for exanple, are clearly nuch nore regular than the needles of TiFe2 protruding inte Ti49Ni24Fe27' In the first case an orientation relatioo exists between
the releVant phases, leading te parallel needles or fixed angles
between the Deedles.
Petween
TiFe2 and Ti49Ni24Fe27 such a relation basFig. 5. Concentration profiles in the diffusion couples TiN;-NiCu (a)
and TiNi-NiFe (b), both annealed 100 hours at 900oC.
D • Ti o • Ni + .Cu
400
- - - I• • firn300
200
587
+~+.++ t +,+ +r+ I100
o ,
"Ni Cu" TiNVA 0 "TiNi"
•
+
• •
100
-at%Î
0 00 +50 -
•
•
++ 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 8 8 9 1 2 1 '&0 DDDDDDDDDDDD 0 0 DDDutr
"TiNi" 2phases "'NiFe" ,r
T
100
-I I • Ti • D atOJo'.
, .NiÎ
•
0,,
• Fe I + I I I..
50 -
•
• •
'&~: ij 0a
8
o 0 0 0 0 0 0 8 B 9 121 D D D D D D D D 0 0 ' 0q
0 I,
I I,
I I I + + I + + +o ,
,Do,D~
I I + + +I It
+, + , + , + I100
200
300
400
• ).Irn( b)
p
-Ti
Ni
Fig. 6. Same diffusion paths on the 900
0C isotherm of the Ti-Ni-Cu
phase diagram.
carplicated by the fact that also in sate grain boundaries in this a1loy the TiFe
2 phase is fOnted.
'1be pcssibility of the presence of an orientation relatioo is, in
any case, not sufficient in order te create interface perturbatiOlS, since then the effect had te he seen in m::>re couples .
we
believe, therefare, that the diffusioo nechani.sm plays an inp:>rtant role. It is a Well-kncwn fact that in single phase ternary alloys it already takes foor independent diffusim ccefficients in order te describe the~:ri
TiNi
Ti Fe
~~~~
a-Fe
Y-{Ni,Fe}
Fig. 7.
Some diffusion paths on the
gDDOe
isothenm of the Ti-Ni-Fe
phase diagram.
diffusion kinetics • In an actual multiphase diffusion couple in which
e.g. UNo phases are fonted this leads te 16 independent diffusial
cref-ficients which can all be coo.centratial dependent. ~ do oot believe, however, that the question of interface instability can be solved by analysing the diffusion nechanism along theSe lines,apart fran the
experinental difficulties.
In a qualitative way, al the other" hand, i t might he pa;sible te find keys to a soluticn of the proolem in a similar way as shown in a forner studyen the Mo-Si-C systern [6] and which follows essentially
~-T
i
Ni
/ / / / ///
Tie
O2C
c u
bJ
//
,/
z~~iC02Chex'>fzzi/~ZZZZZ!mZ~~~~~~~~77m'!fÎlÎ,~
Tie
03Y-CNi.Co)
Fig. 8. Same diffusion paths on the 900°C isothenm of the Ti-Ni-Co
phase diagram.
a line given by wagner [7] for oxidation processes. Catpare, for instanee , in Fig. 9 the couples .TiNi~iFe ànd TiNi-NiCu and let us cx::ncentrate en the interface TiNi]-NiMe.
In bath cases·Ti will ba the less nohile CXI'lpOI1ent in the TiNi 3
phase in view of the locatien of the Kirkendall interface, and Ni is
pmfere.ntly withdrawn fran the NiMe alloy. If the arrival of Ni atcm; at the interface is rate-det:eJ:mining for the grcwth of the TiNi
3 phase, then
.
thi.S layer·. gr~ faster at point 1 than at point 2, so an accidental perturbation will grON. If the Supply of Ti israte-TiNi
TiNi
o
A
Ti N
iJ
~Ti
---fNi
---
--
--
---591
Fig. 9. Schematic representation of the diffusion layers in the couples
TiNi-NiFe and TiNi-NiCu.
detennining, then the layer will grcM faster at point 2 than at point 1 and the interface will stay straight.
Since the diffusim rate of Ti in TiNi
3 can he expe.cted te be roughly the sane for the Ti-Ni-Fe and Ti-Ni-CU system, the difference
between both systems shoold then he the faster diffusion of Ni in a
NiCu alloy than in a NiFe alloy. 'lhis is indeed repOrted in the litera-ture [8] and bas been verified by us in diffusicn e:xperi.IIents on the c:ouples NiFe-Fe and NiCu-CU. As a consequence, the prcduct layer in the
Ti-Ni
-cu
system should be thicker than in the Ti-Ni-Fe system which is indeed the case. '!he perturbation effect IID.lSt beccne m:>re pronounced if the SUH?ly of Ni gets less, i.e. when using alloys poorer in Ni. This is indeed true as ean be seen frem Figs. 2 and 3 where at the endNiCu
NiFe
even in the Ti-Ni
-cu
system the interface is net straight anynore. 5emi.-quantitativelyour results satisfy wagners canditic:n, whichstates that straight interfaces occur if the quantity Q> 1, whereas
serrated bamdaries may occur if Q < 1, where Q is a functian of the
relevant diffusion coefficients and cc:ncentratians
[7J.
\'ë believe that these relatively sinple consideratioos will be
very useful in predicting the occurrence of perturbations in reactic:n interfaces in temary diffusic:n ooupl.es. 'Ihis nay be of teclmological inportance in view of the adherence of e.g. coatings on Substrates •
Refemnces
1. F.J.J. van IDa, G.F. Bastin and A.J.H. Ieenen,
J.
Less-oammcn Met., 57 (1978) 111.2. F.J.J. van !Do, J.W.G.A. Vrolijk and G.F. Bastin,
J.
Less-oammcnMet.,
77 (1981) 121. 3. F.J.J. van !Do and G.F. Bastin,J.
Less-acmmcn Met., 81 (1981) 61.4. U. Zwicker, E. Kalsch, T. Nishinura,
o.
Ott and H. seilstarfer, Metall 20 (1966) 1252.5. W.G. M:>ffat, '!he H.andbcx>k of Binary Phase Diagrans , General Electric Catpany,'SChenectady, N. Y., 1978. 6. F.J.J. van IDa, F.M. Srret, G.O. Rieck and G. Verspui,
Proc. Plansee-seminar 1981, Vol. 1, p. 141. 7. C. Wagner,
J.
El~.Soc.,
103 (1956) 571.8. Y. J\dda and J. Philibert, Ia Diffusic:n dan les Solides , Tc:1te 11, Presses Universitaires de France, Paris 1966.