UvA-DARE is a service provided by the library of the University of Amsterdam (https://dare.uva.nl)
UvA-DARE (Digital Academic Repository)
New Experimental Methods for Perturbation Crystallography.
Heunen, G.W.J.C.
Publication date
2000
Link to publication
Citation for published version (APA):
Heunen, G. W. J. C. (2000). New Experimental Methods for Perturbation Crystallography.
General rights
It is not permitted to download or to forward/distribute the text or part of it without the consent of the author(s) and/or copyright holder(s), other than for strictly personal, individual use, unless the work is under an open content license (like Creative Commons).
Disclaimer/Complaints regulations
If you believe that digital publication of certain material infringes any of your rights or (privacy) interests, please let the Library know, stating your reasons. In case of a legitimate complaint, the Library will make the material inaccessible and/or remove it from the website. Please Ask the Library: https://uba.uva.nl/en/contact, or a letter to: Library of the University of Amsterdam, Secretariat, Singel 425, 1012 WP Amsterdam, The Netherlands. You will be contacted as soon as possible.
Tablee of Contents
11 INTRODUCTION 1 1.11 PIEZOELECTRICITY 1 1.22 SUBJECT oi THESIS -1.33 OUTLINE 3 REFERENCESS 3 22 THEORY 5 2.11 INTRODUCTION 5 2.22 PIEZOELECTRICITY 5 2.33 X-KAY DIFFRACTION '0 2.44 X-RAY SOURCES 13 REFERENCESS -333 THE MODULATION METHOD 25
3.11 INTRODUCTION 25 3.22 MODULATION METHOD 25 3.33 SAMPLE PREPARATION 28 3.44 EXPERIMENTAL. STATIONS 32
3.55 SOFTWARE 36 3.66 RESULTS AND DISCUSSION 39
3.77 CONCLUSION 46 REFERENCESS 47
44 A NEW DETECTION SYSTEM 49
4.11 INTRODUCTION 49 4.22 SCINTILLATION COUNTER 50 4.33 NEW DETECTION SYSTEM 50 4.44 CRYSTALS IN ELECTRIC FIELDS 60
4.55 CONCLUSION 65 REFERENCESS 66
55 THE BROAD-ENERGY X-RAY BAND 67
5.11 INTRODUCTION 67 5.22 BROAD-ENERGY X-RAY BAND 68
PARTT A: BENT-LAUE 73
5.33 THEORY 73 5.44 OPTICS SET-UP 76 5.55 SAMPLES 78 5.66 ELECTRIC FIFED AND G A UNCI SYSTEM 80
5.77 EXPERIMENTAL STATIONS 80
PARTT B: MULTI-LAYER 93
5.88 THEORY 93 5.99 OPTICS SET-UP 94
5.100 S O F T W A R H D F V F I O P M L N T 95 5.111 EXPF.RIMRNTAL S T A T I O N 97
5.122 C O N C L U S I O N 104
RlTLRLNCFSS 105
66 APPLICATION OF T H E BROAD-ENERGY X-RAY B A N D M E T H O D 107
6.11 INTRODUCTION 107 6.22 R F I Ï N L M F N T 107 6 . 33 EXFLRIMLNTAI 1 1 2 6.44 D A T A A N A L Y S I S AND RF.DL'CTION 112 6.55 R h S i i T S AND DISCUSSION 113 6.66 C O N C L U S I O N 116 R L I - L R L N C L SS 116 S U M M A R YY 119 S A M E N V A T T I N GG 122 A P P E N D I XX A 125 PlFZOFLFCTRICMODUll I 125 R F F H R F N C FF 126 A P P E N D I XX B 127 P I F Z O F F F C T R I CC M A T E R I A L S U S F D 127 R F F F R F N C L SS 130 C U R R I C U L U MM V1TAE 133 N A W O O R DD 134